Activity Migration in M-of-N-Systems by Means of Load-Balancing

The continued scaling of microelectronic elements down to atomic dimensions has a growing negative influence on their reliability and lifetime. Countermeasures like self repair and destressing are able to slow down this development, whereby a combination of these approaches promises even better results. This paper describes an extension of a M-of-N-systems with activity migration by load balancing and especially the for this purpose implemented control logic. These extensions enable the workload to be fairly distributed over all fault free functional units, even if one to all redundant units fail and without interaction of the user. This ensures an even ageing process of the whole system.