DocumentCode
2610527
Title
A Method of Detecting Hot Spots on Semiconductors using Liquid Crystals
Author
Hiatt, John
Author_Institution
HEWLETT-PACKARD COMPANY, 1400 Fountain Grove Parkway, Santa Rosa, California 95404
fYear
1981
fDate
29677
Firstpage
130
Lastpage
133
Abstract
This paper presents a failure analysis technique which uses cholesteric liquid crystals and polarized light to locate areas of high power dissipation on an integrated circuit. The technique is non-destructive and can be performed in a few minutes using common failure analysis equipment. An example is given involving the analysis of a CMOS latch-up mechanism.
Keywords
Crystalline materials; Failure analysis; Integrated circuit packaging; Liquid crystals; Monolithic integrated circuits; Optical microscopy; Optical polarization; Optical scattering; Optical surface waves; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1981. 19th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1981.362984
Filename
4208383
Link To Document