A 2.3 ps time-domain reflectometer for millimeter-wave network analysis

Author

Yu, Ruai Y. ; Kamegawa, Masayuki ; Case, Michael ; Rodwell, Mark ; Franklin, Jeff

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

fYear

1991

fDate

5-7 Aug 1991

Firstpage

261

Lastpage

269

Abstract

A GaAs monolithic time-domain reflectometer (TDR) for millimeter-wave network analysis has been fabricated. The nonlinear transmission line (NLTL)-based TDR has two outputs from which the incident and reverse waves can be determined. The two channels show a 2.3-ps falltime, and hence a 150-GHz 3-dB TDR bandwidth. The reflection coefficient in the time domain obtained after a partial calibration clearly indicates a prominent reflection when the TDR is under open-circuitry load. With the use of network analysis calibration routines, corrected millimeter-wave vector measurements will be feasible with these devices

Keywords

III-V semiconductors; calibration; gallium arsenide; microwave reflectometry; reflectometers; time-domain reflectometry; 150 GHz; 2.3 ps; GaAs; NLTL; bandwidth; falltime; millimeter-wave network analysis; millimeter-wave vector measurements; monolithic time-domain reflectometer; network analysis calibration routines; nonlinear transmission line; open-circuitry load; reflection coefficient; reverse waves; semiconductors; Bandwidth; Circuits; Coplanar waveguides; Diodes; Millimeter wave measurements; Millimeter wave technology; Millimeter wave transistors; Sampling methods; Signal generators; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

High Speed Semiconductor Devices and Circuits, 1991., Proceedings IEEE/Cornell Conference on Advanced Concepts in

Conference_Location

Ithaca, NY

Print_ISBN

0-7803-0491-8

Type

conf

DOI

10.1109/CORNEL.1991.169994

Filename

169994