• DocumentCode
    2610782
  • Title

    Effects of perimeter recombination on GaAs-based solar cells

  • Author

    Stellwag, T. ; Dodd, P. ; Carpenter, M. ; Lundstrom, M. ; Pierret, R. ; Melloch, M. ; Yablonovitch, F. ; Gmitter, T.

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    442
  • Abstract
    Perimeter recombination currents have been experimentally characterized on GaAs p/n heteroface diodes and solar cells with areas ranging from 2.5×10-5 to 0.25 cm2. Under 1-sun operation at the maximum power point, measurements show that the n≈2 perimeter recombination current component degrades the cell´s fill factors but does not greatly affect the open-circuit voltage. The n≈2 perimeter recombination currents are examined theoretically on small-area cells using a two-dimensional drift-diffusion device simulator, PUPHS2D. This model verifies the importance and origin of perimeter recombination in heteroface GaAs-based solar cells. Two methods of reducing the n≈2 perimeter recombination are explored
  • Keywords
    III-V semiconductors; electron-hole recombination; gallium arsenide; solar cells; 1-sun operation; 2D drift-diffusion device simulator; GaAs solar cells; PUPHS2D; fill factors; heteroface; open-circuit voltage; perimeter recombination currents; semiconductor; Current measurement; Dark current; Degradation; Diodes; Gallium arsenide; Molecular beam epitaxial growth; Optical films; Photovoltaic cells; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
  • Conference_Location
    Kissimmee, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.1990.111663
  • Filename
    111663