Title :
Fast solution of inverse problems in the RF domain using topological sensitivity and hybrid-ON/OFF method
Author :
Byun, Jin-Kyu ; Lee, Hyang-Beom ; Kim, Dong-Hun
Author_Institution :
Sch. of Electr. Eng., Soongsil Univ., Seoul, South Korea
Abstract :
Topological sensitivity (TS) formulation is derived, for the first time in RF domain, and applied to the hybrid-ON/OFF method for the fast solution of inverse problems. The formulation is based on continuum approach and adjoint variable method. The TS is directly calculated from volume field solutions, and used to determine the ON/OFF status of the unit cell. The proposed method is applied to dielectric material reconstruction, and the results show the validity and effectiveness of the proposed method.
Keywords :
dielectric materials; sensitivity analysis; RF domain; adjoint variable method; continuum approach; dielectric material reconstruction; hybrid-on/off method; topological sensitivity; Dielectric materials; Inverse problems; Material properties; Radio frequency; Shape; Solids;
Conference_Titel :
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7059-4
DOI :
10.1109/CEFC.2010.5481528