DocumentCode :
2610959
Title :
Fast solution of inverse problems in the RF domain using topological sensitivity and hybrid-ON/OFF method
Author :
Byun, Jin-Kyu ; Lee, Hyang-Beom ; Kim, Dong-Hun
Author_Institution :
Sch. of Electr. Eng., Soongsil Univ., Seoul, South Korea
fYear :
2010
fDate :
9-12 May 2010
Firstpage :
1
Lastpage :
1
Abstract :
Topological sensitivity (TS) formulation is derived, for the first time in RF domain, and applied to the hybrid-ON/OFF method for the fast solution of inverse problems. The formulation is based on continuum approach and adjoint variable method. The TS is directly calculated from volume field solutions, and used to determine the ON/OFF status of the unit cell. The proposed method is applied to dielectric material reconstruction, and the results show the validity and effectiveness of the proposed method.
Keywords :
dielectric materials; sensitivity analysis; RF domain; adjoint variable method; continuum approach; dielectric material reconstruction; hybrid-on/off method; topological sensitivity; Dielectric materials; Inverse problems; Material properties; Radio frequency; Shape; Solids;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7059-4
Type :
conf
DOI :
10.1109/CEFC.2010.5481528
Filename :
5481528
Link To Document :
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