• DocumentCode
    2611030
  • Title

    System Adaptivity and Fault-Tolerance in NoC-based MPSoCs: The MADNESS Project Approach

  • Author

    Meloni, Paolo ; Tuveri, Giuseppe ; Raffo, Luigi ; Cannella, Emanuele ; Stefanov, Todor ; Derin, Onur ; Fiorin, Leandro ; Sami, Mariagiovanna

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Cagliari, Cagliari, Italy
  • fYear
    2012
  • fDate
    5-8 Sept. 2012
  • Firstpage
    517
  • Lastpage
    524
  • Abstract
    Modern embedded systems increasingly require adaptive run-time management. The system may adapt the mapping of the applications in order to accommodate the current workload conditions, to balance load for efficient resource utilization, to meet quality of service agreements, to avoid thermal hot-spots and to reduce power consumption. As the possibility of experiencing run-time faults becomes increasingly relevant with deep-sub-micron technology nodes, in the scope of the MADNESS project, we focus particularly on the problem of graceful degradation by dynamic remapping in presence of run-time faults. In this paper, we summarize the major results achieved in the MADNESS project until now regarding the system adaptivity and fault tolerant processing. We report the first results of the integration between platform level and middleware level support for adaptivity and fault tolerance. A case study demonstrates the survival ability of the system via a low-overhead process migration mechanism and a near-optimal online remapping heuristic.
  • Keywords
    embedded systems; fault tolerance; integrated circuit reliability; microprocessor chips; network-on-chip; MADNESS project approach; NoC-based MPSoC; QoS; adaptive run-time management; deep-submicron technology nodes; dynamic remapping; embedded systems; fault tolerant processing; low-overhead process migration mechanism; middleware level; near-optimal online remapping heuristic; platform level; power consumption reduction; quality of service agreements; resource utilization; survival ability; thermal hot-spots avoidance; workload conditions; Computational modeling; Fault tolerance; Fault tolerant systems; Middleware; Program processors; Tiles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2012 15th Euromicro Conference on
  • Conference_Location
    Izmir
  • Print_ISBN
    978-1-4673-2498-4
  • Type

    conf

  • DOI
    10.1109/DSD.2012.122
  • Filename
    6386935