• DocumentCode
    2611033
  • Title

    Off-state PHEMT breakdown: a temperature-dependent analysis

  • Author

    Cova, P. ; Gallinari, D. ; Delmonte, N. ; Alessi, R. ; Menozzi, R.

  • fYear
    2003
  • fDate
    2003
  • Firstpage
    31
  • Lastpage
    56
  • Keywords
    Electric breakdown; Gallium arsenide; Iron; Measurement standards; PHEMTs; Semiconductor diodes; Solid state circuits; Temperature; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    GaAs Reliability Workshop, 2003. Proceedings
  • Print_ISBN
    0-7908-0104-3
  • Type

    conf

  • DOI
    10.1109/GAASRW.2003.183766
  • Filename
    1397317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2611033