DocumentCode
2611045
Title
An efficient tolerance design procedure for yield maximization using optimization techniques and neural network
Author
Chen, Richard M M ; Chan, Wilson W.
Author_Institution
Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
fYear
1993
fDate
3-6 May 1993
Firstpage
1793
Abstract
Various optimization formulations are analyzed for the determination of design parameters and their tolerances to achieve maximum yield and minimum cost. Three approaches for this objective are presented. Through a numerical example, it is concluded that a procedure using a neural network approach followed by a fine tuning algorithm is recommended for efficiency and reliability
Keywords
circuit optimisation; circuit reliability; design engineering; integrated circuit yield; neural nets; tolerance analysis; design parameters; fine tuning algorithm; minimum cost; neural network; optimization techniques; reliability; tolerance design procedure; yield maximization; Algorithm design and analysis; Constraint optimization; Cost function; Design automation; Design optimization; Lagrangian functions; Monte Carlo methods; Neural networks; Production; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location
Chicago, IL
Print_ISBN
0-7803-1281-3
Type
conf
DOI
10.1109/ISCAS.1993.394093
Filename
394093
Link To Document