Title :
SENSATION: A new environment for automatic circuit optimization and statistical analysis
Author :
Kim, Yeong-Gil ; Lee, Jai-Hoon ; Kim, Kyung-Ho ; Lee, Sang-Hoon
Author_Institution :
Samsung Electronics, Kyungki-Do, South Korea
Abstract :
A new environment, SENSATION for circuit optimization and statistical analysis has been developed. It provides real-time optimization and includes automatic algorithms to assist for reaching optimal points. A statistical analysis environment is presented, which aids in Monte Carlo analysis, worst case corner analysis, and sensitivity analysis. This capability facilitates the characterization of the effects of several operating conditions and manufacturing process parameters on the design performances. Experimental results illustrating the advantages of the proposed methods are discussed
Keywords :
Monte Carlo methods; circuit analysis computing; circuit optimisation; digital simulation; sensitivity analysis; statistical analysis; Monte Carlo analysis; SENSATION; automatic circuit optimization; manufacturing process parameters; operating conditions; optimal points; real-time optimization; sensitivity analysis; statistical analysis; worst case corner analysis; Circuit optimization; Circuit synthesis; Computer aided engineering; Design automation; Design optimization; Engines; Graphics; Product development; Sensitivity analysis; Statistical analysis;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.394094
