DocumentCode :
2611193
Title :
Recognition and semi-differential invariants
Author :
Van Gool, L. ; Kempenaers, P. ; Oosterlinck, A.
Author_Institution :
Katholieke Univ., Leuven, Belgium
fYear :
1991
fDate :
3-6 Jun 1991
Firstpage :
454
Lastpage :
460
Abstract :
Semidifferential invariants, combining coordinates in different points together with their derivatives, are used for the description of planar contours. Their use can be seen as a tradeoff between two extreme strategies currently used in shape recognition: (invariant) feature extraction methods, involving high-order derivatives, and invariant coordinate descriptions, leading to the correspondence problem of reference points. The method for the derivation of such invariants, based on Lie group theory and applicable to a wide spectrum of transformation groups, is described. As an example, invariant curve parameterizations are developed for affine and projective transformations. The usefulness of the approach is illustrated with two examples: (1) recognition of a test set of 12 planar objects viewed under conditions allowing affine approximations, and (2) the detection of symmetry in perspective projections of curves
Keywords :
computer vision; pattern recognition; Lie group; affine approximations; coordinates; derivatives; feature extraction; high-order derivatives; invariant coordinate descriptions; invariant curve parameterizations; planar contours; reference points; semi-differential invariants; shape recognition; transformation groups; Coordinate measuring machines; Differential equations; Feature extraction; Object detection; Object recognition; Robustness; Shape; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Conference_Location :
Maui, HI
ISSN :
1063-6919
Print_ISBN :
0-8186-2148-6
Type :
conf
DOI :
10.1109/CVPR.1991.139735
Filename :
139735
Link To Document :
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