Title :
VSSI [X] control charts for processes with multiple assignable causes
Author :
Lee, H.J. ; Lim, T.J. ; Jang, S.C.
Author_Institution :
Korea Atomic Energy Res. Inst., Daejeon
Abstract :
This research investigates the statistical efficiency of variable sample size and sampling interval (VSSI) X macr control charts under multiple assignable causes. Algorithms for calculating the average run length (ARL) and average time to signal (ATS) of a VSSI X macr control chart are proposed by employing the Markov chain method. States of a process are defined in vector forms according to the location of a control statistic and the occurrence states of the assignable causes. Initial probabilities and transition probabilities are carefully derived from the definitions of the states. Statistical properties of the proposed control chart are also investigated. Illustrative examples show that the VSSI X macr control chart is superior to the VSS or VSI X macr control chart as well as to the Shewhart X macr control chart in a statistical sense, even under multiple assignable causes.
Keywords :
Markov processes; control charts; probability; process control; vectors; Markov chain method; average run length calculation; average time to signal calculation; control charts; control statistic; multiple assignable causes; occurrence states; process control; statistical efficiency; transition probabilities; variable sample size; variable sampling interval; vector; Adaptive control; Control charts; Electrical equipment industry; Monitoring; Probability; Programmable control; Risk management; Sampling methods; Statistics; Variable structure systems; ATS; Markov chain; Quality control; VSSI control chart; multiple causes;
Conference_Titel :
Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1529-8
Electronic_ISBN :
978-1-4244-1529-8
DOI :
10.1109/IEEM.2007.4419390