• DocumentCode
    2611306
  • Title

    A Neural Network ensemble for classifying source(s) in multivariate manufacturing processes

  • Author

    Yu, Jian-Bo ; Xi, Li-feng

  • Author_Institution
    Shanghai Jiaotong Univ., Shanghai
  • fYear
    2007
  • fDate
    2-4 Dec. 2007
  • Firstpage
    1246
  • Lastpage
    1250
  • Abstract
    In multivariate statistical process control, most multivariate quality control charts are shown to be effective in detecting out-of-control signals based upon an overall statistics. But these charts do not relieve the need for pinpointing the source(s) of the out-of-control signals. Neural networks (NNs) have excellent noise tolerance and high pattern identification capability, which have been used successfully in MSPC. This study proposed a selective NNs ensemble approach DPSOEN, where several NNs selected are jointly used to classify source(s) of out-of-control signals in multivariate processes. Extensive experiment is also carried out to examine effects of six statistical features on the performance of DPSOEN. The investigation proposed a heuristic approach for applying DPSOEN as an effective tool to identify abnormal source(s) in bivariate SPC with potential application for MSPC in general.
  • Keywords
    control charts; manufacturing processes; neural nets; quality control; statistical process control; DPSOEN; classifying sources; multivariate manufacturing processes; multivariate quality control charts; multivariate statistical process control; neural network ensemble; noise tolerance; out-of-control signals; pattern identification capability; statistical features; Artificial neural networks; Control charts; Manufacturing processes; Monitoring; Neural networks; Quality control; Signal detection; Signal processing; Statistical analysis; Statistics; Multivariate control chart; Multivariate manufacturing processes; Neural network ensemble;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1529-8
  • Electronic_ISBN
    978-1-4244-1529-8
  • Type

    conf

  • DOI
    10.1109/IEEM.2007.4419391
  • Filename
    4419391