• DocumentCode
    2611354
  • Title

    A new process capability index under multiplicative adjustment of process mean and its demonstration procedures

  • Author

    Kim, K.W. ; Yum, B.J.

  • Author_Institution
    Korea Adv. Inst of Sci. & Technol., Daejeon
  • fYear
    2007
  • fDate
    2-4 Dec. 2007
  • Firstpage
    1269
  • Lastpage
    1272
  • Abstract
    In the process capability study, it has been undisputedly assumed that the standard deviation of a quality characteristic is unchanged even if its mean is adjusted for the purpose of process centering. However, this assumption is not valid for the case of the multiplicative adjustment of the mean, which appears more commonly in practice. In addition, little research has addressed the issue of "process capability demonstration". In this paper, a new process capability index is proposed for the nominal-the-best characteristic under the multiplicative adjustment of the mean, its lower confidence limit is derived, and a demonstration procedure is developed so that the required sample size can be determined to achieve a desired probability of successfully demonstrating that the process capability index meets the target with a specified level of confidence.
  • Keywords
    process capability analysis; quality control; process capability demonstration; process capability index; process mean multiplicative adjustment; quality characteristics; standard deviation; Industrial engineering; Niobium; Reliability engineering; Lower confidence limit; Multiplicative adjustment; Process capability demonstration.; Process capability index;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1529-8
  • Electronic_ISBN
    978-1-4244-1529-8
  • Type

    conf

  • DOI
    10.1109/IEEM.2007.4419396
  • Filename
    4419396