Title :
A new process capability index under multiplicative adjustment of process mean and its demonstration procedures
Author :
Kim, K.W. ; Yum, B.J.
Author_Institution :
Korea Adv. Inst of Sci. & Technol., Daejeon
Abstract :
In the process capability study, it has been undisputedly assumed that the standard deviation of a quality characteristic is unchanged even if its mean is adjusted for the purpose of process centering. However, this assumption is not valid for the case of the multiplicative adjustment of the mean, which appears more commonly in practice. In addition, little research has addressed the issue of "process capability demonstration". In this paper, a new process capability index is proposed for the nominal-the-best characteristic under the multiplicative adjustment of the mean, its lower confidence limit is derived, and a demonstration procedure is developed so that the required sample size can be determined to achieve a desired probability of successfully demonstrating that the process capability index meets the target with a specified level of confidence.
Keywords :
process capability analysis; quality control; process capability demonstration; process capability index; process mean multiplicative adjustment; quality characteristics; standard deviation; Industrial engineering; Niobium; Reliability engineering; Lower confidence limit; Multiplicative adjustment; Process capability demonstration.; Process capability index;
Conference_Titel :
Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1529-8
Electronic_ISBN :
978-1-4244-1529-8
DOI :
10.1109/IEEM.2007.4419396