DocumentCode
2611423
Title
Recent results in optical processing of silicon sheet
Author
Serra, J. ; Vallêra, A.
Author_Institution
Dept. de Fisica, Lisboa Univ., Portugal
fYear
1990
fDate
21-25 May 1990
Firstpage
615
Abstract
Recent results from the recrystallization of a silicon sheet by a molten zone optical processing technique are reported. The apparatus has been used with promising results in Silso wafers (as a test material) and in preribbons produced by plasma gun deposition and electron beam processing. The use of the apparatus for obtaining thin ribbons (<200 μm) starting from ordinary preribbons (~0.5 mm) has been demonstrated. This process, called STTRECH, may lead to an important reduction in solar cell cost
Keywords
elemental semiconductors; recrystallisation; semiconductor technology; silicon; STTRECH; Si sheet; Silso wafers; electron beam processing; molten zone optical processing; plasma gun deposition; recrystallization; solar cell cost reduction; Costs; Crystallization; Electron beams; Lamps; Mirrors; Photovoltaic cells; Plasma applications; Plasma materials processing; Silicon; Surface cracks;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location
Kissimmee, FL
Type
conf
DOI
10.1109/PVSC.1990.111693
Filename
111693
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