DocumentCode
2611507
Title
Simulation study of EIT inverse problem based on Bayesian method
Author
Li, Ying ; Zhao, Huifang ; He, Renjie ; Rao, Liyun ; Shen, Xueqin ; Yan, Weili ; Khoury, Dirar S. ; Feng, Lijie ; Hong, Jie ; Wang, Hongbin ; Xu, Guizhi
Author_Institution
Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China
fYear
2010
fDate
9-12 May 2010
Firstpage
1
Lastpage
1
Abstract
The prior of blocky resistivity profile is formulated based on the minimal of total variation using Bayesian method, and the resistivity distribution is reconstructed by Maximum a posteriori (MAP). The Markov chain Monte Carlo (MCMC) method with Gibbs sampler is used to sample from posterior density. The simulations on the 2D model show the feasibility of the method.
Keywords
Bayes methods; Markov processes; Monte Carlo methods; electric impedance imaging; inverse problems; Bayesian method; EIT inverse problem; Gibbs sampler; Markov chain Monte Carlo method; blocky resistivity profile; posterior density; Bayesian methods; Conductivity; Density measurement; Electromagnetic fields; Image reconstruction; Image sampling; Impedance; Inverse problems; Monte Carlo methods; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location
Chicago, IL
Print_ISBN
978-1-4244-7059-4
Type
conf
DOI
10.1109/CEFC.2010.5481561
Filename
5481561
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