Title :
Simulation study of EIT inverse problem based on Bayesian method
Author :
Li, Ying ; Zhao, Huifang ; He, Renjie ; Rao, Liyun ; Shen, Xueqin ; Yan, Weili ; Khoury, Dirar S. ; Feng, Lijie ; Hong, Jie ; Wang, Hongbin ; Xu, Guizhi
Author_Institution :
Province-Minist. Joint Key Lab. of Electromagn. Field & Electr. Apparatus Reliability, Hebei Univ. of Technol., Tianjin, China
Abstract :
The prior of blocky resistivity profile is formulated based on the minimal of total variation using Bayesian method, and the resistivity distribution is reconstructed by Maximum a posteriori (MAP). The Markov chain Monte Carlo (MCMC) method with Gibbs sampler is used to sample from posterior density. The simulations on the 2D model show the feasibility of the method.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; electric impedance imaging; inverse problems; Bayesian method; EIT inverse problem; Gibbs sampler; Markov chain Monte Carlo method; blocky resistivity profile; posterior density; Bayesian methods; Conductivity; Density measurement; Electromagnetic fields; Image reconstruction; Image sampling; Impedance; Inverse problems; Monte Carlo methods; Tomography;
Conference_Titel :
Electromagnetic Field Computation (CEFC), 2010 14th Biennial IEEE Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-7059-4
DOI :
10.1109/CEFC.2010.5481561
