Title :
Study of Leakage-Based Precoding Scheme That Supports Coordinated Multi-Point Operation for LTE
Author :
Hoshino, Masayuki ; Tong, Hui ; Takata, Tomohumi ; Yuda, Yasuaki ; Imamura, Daichi
Abstract :
This paper investigates leakage-based precoding schemes that support coordinated multi-point (CoMP) operation for Long-Term Evolution (LTE) systems studied in the 3rd Generation Partnership Project. CoMP operation, which improves cooperative transmission among cells and reduces or eliminates intercell interference, enables performance improvement in cell edge and average throughputs. Although leakage-based precoding has been investigated for multiuser multiple-input multiple-output (MIMO) systems, its extension to CoMP requires further analysis of the near-far effect under multicell deployment scenarios. To this end, we propose to incorporate the channel between a victim user equipment (UE) and the cell that serves the victim UE into the leakage-based precoding calculation. We investigated optimal linear scaling of the covariance matrix involving this channel. To determine the benefits of the investigated algorithm, multicell system level evaluations were carried out. This confirmed the improved performance of the system´s average and cell edge throughputs.
Keywords :
3G mobile communication; Long Term Evolution; MIMO communication; cellular radio; covariance matrices; interference suppression; precoding; 3rd Generation Partnership Project; LTE system; Long-Term Evolution system; MIMO system; average throughput; cell edge throughputs; cooperative transmission; coordinated multipoint operation; covariance matrix; intercell interference reduction; leakage-based precoding scheme; multicell deployment scenario; multicell system level evaluation; multiuser multiple-input multiple-output system; optimal linear scaling; performance improvement; victim user equipment; Covariance matrix; Equations; Gain; Interference; MIMO; Mathematical model; Throughput;
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2012 IEEE 75th
Conference_Location :
Yokohama
Print_ISBN :
978-1-4673-0989-9
Electronic_ISBN :
1550-2252
DOI :
10.1109/VETECS.2012.6240076