Title :
Liquid Penetrant Testing for Microelectronic Package Hermeticity
Author :
McCormick, J. ; Lin, H.H. ; Zakraysek, L.
Author_Institution :
Rome Air Development Center, Griffiss Air Force Base, New York 13441, (315) 330-4029
Keywords :
Aging; Degradation; Electronic equipment testing; Fluorescence; Helium; Lenses; Microelectronics; Packaging; Seals; Temperature;
Conference_Titel :
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location :
San Diego, NV, USa
DOI :
10.1109/IRPS.1982.361929
