DocumentCode :
2611607
Title :
Influence of Oxide Characteristics on the Reliability of Bipolar Products
Author :
Tremintin, B.
Author_Institution :
IBM - FRANCE, Matra Harris Semiconducteur, B.P. 942, 44075 NANTES CEDEX - France tel.(40)49.08.20
fYear :
1982
fDate :
30011
Firstpage :
224
Lastpage :
227
Keywords :
Charge measurement; Current measurement; Density measurement; Electric variables measurement; Electronic equipment testing; Equations; FETs; Interface states; Telephony; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location :
San Diego, NV, USa
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1982.361932
Filename :
4208450
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2611607
بازگشت