Title :
High frequency large signal characterization of heterojunction bipolar transistors
Author :
Teeter, Douglas A. ; East, Jack R. ; Haddad, George I.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
A Ka-band active load pull measurement system is described. Its use for measuring the dependence of output power and gain on bias, input power, and frequency of heterojunction bipolar transistors (HBTs) from 26.5 to 40 GHz is reported. To help explain the experimental results a detailed numerical simulation has been used to develop a simple HBT device model. This simplified model includes transit time effects and is easily implemented in commercially available harmonic balance software such as Libra. Measured and simulated results are compared. Both set of results indicate that the primary source of gain compression is caused by the device entering the ohmic region. Device mismatch is an additional compression mechanism for fixed load impedances at high drive levels
Keywords :
heterojunction bipolar transistors; microwave measurement; semiconductor device models; solid-state microwave devices; 26.5 to 40 GHz; EHF; Ka-band; Libra; SHF; active load pull measurement system; bias; compression mechanism; device mismatch; device model; experimental results; fixed load impedances; frequency; gain; gain compression; harmonic balance software; heterojunction bipolar transistors; high drive levels; input power; large signal characterization; microwave characterization; numerical simulation; ohmic region; output power; transit time effects; Error correction; Frequency measurement; Gain measurement; Heterojunction bipolar transistors; Millimeter wave measurements; Millimeter wave technology; Millimeter wave transistors; Numerical simulation; Power measurement; Power system modeling;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1991., Proceedings IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-0491-8
DOI :
10.1109/CORNEL.1991.170000
