DocumentCode :
2611805
Title :
Workshop Report EOS/ESD Damage Failure Trait Photograph Interpretation
Author :
Walker, Roy C.
Author_Institution :
SAR Associates, RR 2 Box 500, Rome, NY 13440, (315 )339-3968
fYear :
1982
fDate :
30011
Firstpage :
278
Lastpage :
283
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location :
San Diego, NV, USa
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1982.361944
Filename :
4208462
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2611805