DocumentCode
2611837
Title
Assurance Procedures for the Control of Electromigration
Author
Bart, John J. ; Walter, Martin
Author_Institution
Reliability and Compatibility Division, Rome Air Development Center, Griffiss AFB NY
fYear
1982
fDate
30011
Firstpage
285
Lastpage
287
Keywords
Aluminum; Conducting materials; Conductive films; Conductors; Current density; Electromigration; Failure analysis; Metallization; Microstructure; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1982. 20th Annual
Conference_Location
San Diego, NV, USa
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1982.361946
Filename
4208464
Link To Document