DocumentCode :
2611844
Title :
Sequential test and parameter estimation for array processing of seismic data
Author :
Sidorovich, Dmitrz V. ; Mecklenbräuker, Christoph F. ; Bohmc, J.F.
Author_Institution :
Dept. of Electr. Eng., Ruhr-Univ., Bochum, Germany
fYear :
1996
fDate :
24-26 Jun 1996
Firstpage :
256
Lastpage :
259
Abstract :
We present a sequential test and parameter estimation technique for measured seismic data from the GERESS array situated in Germany. A new approximation of the test statistic distribution and the test threshold is proposed. The sequentially rejecting Bonferroni-Holm test guarantees a global test level. This allows one to avoid the computationally expensive bootstrap method and leads to a simpler algorithm. Approximate conditional maximum likelihood estimates in the frequency domain are used to overcome the resolution limits of conventional methods for wideband signal processing and to construct the sequential test. The combination of global optimization via genetic algorithm and a local one using the scoring seems to be a good compromise to handle the problem of cumbersome maximization of the log-likelihood function over the parameters of interest. The algorithm for testing the number of signal phases is applied simultaneously with the estimation of the model parameters
Keywords :
array signal processing; frequency-domain analysis; genetic algorithms; geophysical signal processing; maximum likelihood estimation; seismology; sequential estimation; signal resolution; testing; GERESS array; Germany; approximate conditional maximum likelihood estimates; array processing; frequency domain; genetic algorithm; global optimization; global test level; log-likelihood function; maximization; parameter estimation; resolution limits; scoring; seismic data; sequential test; sequentially rejecting Bonferroni-Holm test; signal phases; test statistic distribution; test threshold; wideband signal processing; Array signal processing; Frequency estimation; Maximum likelihood estimation; Parameter estimation; Seismic measurements; Sequential analysis; Signal processing algorithms; Statistical analysis; Statistical distributions; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Statistical Signal and Array Processing, 1996. Proceedings., 8th IEEE Signal Processing Workshop on (Cat. No.96TB10004
Conference_Location :
Corfu
Print_ISBN :
0-8186-7576-4
Type :
conf
DOI :
10.1109/SSAP.1996.534865
Filename :
534865
Link To Document :
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