• DocumentCode
    2612021
  • Title

    Simulated performance optimization of GaAs MESFET amplifiers

  • Author

    Winslow, T.A. ; Trew, R.J. ; Gilmore, P. ; Kelley, C.T.

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1991
  • fDate
    5-7 Aug 1991
  • Firstpage
    393
  • Lastpage
    402
  • Abstract
    A robust global optimizer that is capable of optimizing linear, small-signal and nonlinear, large-signal figures of merit (FOMs) in the presence of a high density of local minima and noise is presented. The optimizer is linked with a large-signal MESFET model and used to investigate the optimization process and parameter extraction for GaAs MESFET amplifiers given the complex structure of the RF performance FOM hypersurface. It is demonstrated that it is necessary to perform optimization using all available physical parameters simultaneously as opposed to sequential optimization using only a few parameters at a time
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; circuit CAD; gallium arsenide; microwave amplifiers; optimisation; radiofrequency amplifiers; semiconductor device models; solid-state microwave circuits; CAD; GaAs; MESFET amplifiers; RF performance; figures of merit; large-signal MESFET model; parameter extraction; robust global optimizer; simulated performance optimisation; Circuit testing; Design automation; Design optimization; Gallium arsenide; MESFET circuits; Noise robustness; Radio frequency; Radiofrequency amplifiers; Semiconductor process modeling; Signal processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1991., Proceedings IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • Print_ISBN
    0-7803-0491-8
  • Type

    conf

  • DOI
    10.1109/CORNEL.1991.170009
  • Filename
    170009