Title :
Molecular dynamics simulation on LO phonon mode decay in Si nano-structure covered with oxide films
Author :
Zushi, T. ; Ohdomari, I. ; Watanabe, T. ; Kamakura, Y. ; Taniguchi, K.
Author_Institution :
Fac. of Sci. & Eng., Waseda Univ., Tokyo, Japan
Abstract :
A series of molecular dynamics (MD) simulations is conducted to investigate the dynamics of longitudinal optical (LO) phonon in Si nano-structure confined with oxide films. This work is motivated by heat issues in nanoscopic devices; it is considered that the LO phonons with low group velocity are accumulated in the nanoscopic device and the electric property deteriorates. We estimate the relaxation time of the LO phonon and investigate its dependency on the oxide thickness. The calculation results show that the LO phonon decays faster as the oxide thickness increases and turns into acoustic phonon. The result indicates that the presence of SiO2 films promotes the scattering of the phonon and this is effective to diminish the optical phonon.
Keywords :
elemental semiconductors; molecular dynamics method; nanostructured materials; phonons; silicon; silicon compounds; Si-SiO2; acoustic phonon; electric property; group velocity; longitudinal optical phonon dynamics; longitudinal optical phonon mode decay; molecular dynamics simulation; nanoscopic devices; oxide films; oxide thickness; phonon scattering; relaxation time; silica films; silicon nanostructure; Acoustics; Films; Heating; Lattices; Nanoscale devices; Phonons; Silicon;
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2010 International Conference on
Conference_Location :
Bologna
Print_ISBN :
978-1-4244-7701-2
Electronic_ISBN :
1946-1569
DOI :
10.1109/SISPAD.2010.5604568