Title :
Rapid Assessment of the Humidity Dependence of IC Failure Modes by Use of HAST
Author :
Gunn, Jeffrey E. ; Camenga, Robert E. ; Malik, Sushil K.
Author_Institution :
International Business Machines Corporation, Dept. A45, Bldg. 052, P. O. Box 390, Poughkeepsie, New York 12602
Keywords :
Acceleration; Atmosphere; Humidity; Kinetic theory; Life estimation; Moisture; Temperature dependence; Testing; Thermal force; Thermal stresses;
Conference_Titel :
Reliability Physics Symposium, 1983. 21st Annual
Conference_Location :
Phoenix, AZ, USA
DOI :
10.1109/IRPS.1983.361963
