Title :
Advanced X-ray analysis of polycrystalline CuInSe2 thin films
Author :
Dittrich, H. ; Menner, R. ; Schock, H.
Author_Institution :
Inst. fuer Physi. Elektronik, Stuttgart Univ., Germany
Abstract :
Advanced X-ray powder diffraction (XRD) analysis of polycrystalline semiconductor thin-films such as CuInSe2 is able to give detailed information of the thin-film structure. A (112) peak profile fitting and pole figure measurements were chosen to give a set of structural data such as integrated intensities, full width at half maximum (FWHM), peak position, Pearson VII exponent and residual error factors, and a quantitative measure of crystallite orientation. These structural data were combined with EDS measurements and solar cell efficiencies. It is shown that for the standard bilayer deposition of lateral Cu/In gradient layers, the maximum efficiency is correlated with maximum texture effects and the point of Cu/In-ratio=1. Discontinuities of changes in peak position, FWHM, and error factors indicate a secondary nucleation process during the overgrowth of the In-rich top layer. Increasing the Cu evaporation temperature step causes increased tendency of the secondary nucleation process. Texture measurements expose the crystallite orientation effect as a fiber texture parallel to [221]
Keywords :
X-ray diffraction examination of materials; copper compounds; indium compounds; semiconductor thin films; solar cells; ternary semiconductors; Cu evaporation temperature step; In-rich top layer; Pearson VII exponent; X-ray powder diffraction; bilayer deposition; crystallite orientation; lateral Cu/In gradient layers; peak profile fitting; pole figure measurements; polycrystalline CuInSe2; residual error factors; secondary nucleation process; solar cell efficiencies; texture measurement; thin films; Crystallization; Diffraction; Distribution functions; Grain size; Measurement standards; Size measurement; Spatial resolution; Surface morphology; Transistors; X-ray scattering;
Conference_Titel :
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location :
Kissimmee, FL
DOI :
10.1109/PVSC.1990.111728