Title :
Rate-Determining Factor of Aluminum Corrosion and a Rapid Method of Assessing the Moisture Resistance of Plastic Encapsulated LSI
Author :
Tsubosaki, K. ; Wakashima, Y. ; Nagasima
Author_Institution :
Musashi Works, Hitachi, Ltd., 1450 Josuihon-cho, Kodaiara-shi, Tokyo 187, Japan
Abstract :
New information about the aluminum corrosion of plastic encapsuled LSI was derived from measuring the leakage current on the die surface. Aluminum corrosion at temperature/humidity tests depends upon the water film produced at the interface between the molding resin and die. The moisture resistance of plastic encapsulated LSI can be rapidly evaluated by electrical leakage which can be related to water film formation.
Keywords :
Aluminum; Corrosion; Current measurement; Electrical resistance measurement; Large scale integration; Leakage current; Moisture; Plastics; Surface resistance; Temperature dependence;
Conference_Titel :
Reliability Physics Symposium, 1983. 21st Annual
Conference_Location :
Phoenix, AZ, USA
DOI :
10.1109/IRPS.1983.361965
