DocumentCode
2612213
Title
Parametric Modeling of the Cross-Correlation for Large-Scale-Fading of Propagation Channels
Author
Yin, Xuefeng ; Zhou, Xu ; Zhang, Zhifeng ; Kim, Myung-Don ; Chung, Hyun Kyu
Author_Institution
Sch. of Electron. & Inf. Eng., Tongji Univ., Shanghai, China
fYear
2012
fDate
6-9 May 2012
Firstpage
1
Lastpage
5
Abstract
Accurate models of the cross-correlation of the large-scale-fading in different propagation channels is essential for designing wireless systems using distributed transmission topologies, such as the coordinated multi-point (CoMP) transmission system. In this contribution, a new parameter defined as the normalized power of common paths in two propagation channels is applied to modeling the cross-correlation of the large-scale-fading in different channels. The common paths here are referred to as the paths with identical parameters, i.e. the delays, Doppler frequencies, directions of arrival and directions of departure. Under the uncorrelated scattering (US) assumption, a new geometrical approach is proposed for modeling the large-scale-fading cross-correlation. Experimental investigations show that the proposed modeling method can be used to generate channel cross-correlation coefficients consistent with the experimental results to a certain extent. We postulate that the discrepancies observed between the empirical and theoretical results are caused by the unrealistic US assumption.
Keywords
correlation methods; direction-of-arrival estimation; fading channels; telecommunication network topology; Doppler frequencies; coordinated multi-point transmission system; cross-correlation; directions of arrival; directions of departure; distributed transmission topologies; large-scale-fading; parametric modeling; propagation channels; uncorrelated scattering assumption; wireless systems; Antenna measurements; Antenna radiation patterns; Channel models; Correlation; Fading; Indexes; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference (VTC Spring), 2012 IEEE 75th
Conference_Location
Yokohama
ISSN
1550-2252
Print_ISBN
978-1-4673-0989-9
Electronic_ISBN
1550-2252
Type
conf
DOI
10.1109/VETECS.2012.6240115
Filename
6240115
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