• DocumentCode
    2612335
  • Title

    Analytical model of electrostatic fixed-fixed microbeam for pull-in voltage

  • Author

    Xiezhao Lin ; Ying, Ji ; Xiezhao Lin

  • Author_Institution
    Coll. of Mech. & Energy Eng., ZheJiang Univ., Hangzhou
  • fYear
    2008
  • fDate
    2-5 July 2008
  • Firstpage
    803
  • Lastpage
    807
  • Abstract
    The pull-in problem of fixed-fixed beam structures cannot be solved analytically due to its nonlinear from the large deflection and the electrostatic driving force. So to understanding the characters of the devices, the designers have to resort to numerical techniques. Lack of an accurate model for predicting pull-in voltage for basic micromachined beam structures necessitates the clear need for a closed form expression for the pull-in voltage. A new analytical model has been developed based on Rayleigh-Ritz method for determining the pull-in voltage of an electrostatically actuated micro-beam. Three new parameters with the dimension of voltage square have been introduced for considering the contribution from stretch stress gradient non-linear stiffening, bending, and the residual stress. Thus, the model can takes into account the effects of axial stress, residual stress, stretch stress gradient non-linear stiffening, and fringing fields on the pull-in voltage. Modeling result has been compared with published work of other researchers available in the literature and FEM simulation results, it is found the presented model estimation results agree well with FEM simulated results in most common case.
  • Keywords
    beams (structures); bending; electrostatic actuators; finite element analysis; internal stresses; microactuators; stress analysis; FEM simulation; Rayleigh-Ritz method; axial stress; bending; electrostatic driving force; electrostatic fixed-fixed microbeam; fringing fields; micromachined beam structures; numerical techniques; pull-in voltage; residual stress; stretch stress gradient nonlinear stiffening; voltage square; Analytical models; Closed-form solution; Educational institutions; Electrostatic analysis; Electrostatic measurements; Microelectromechanical devices; Micromechanical devices; Predictive models; Residual stresses; Voltage; assumed modal method; electrostatically actuated; energy method; pull-in voltages;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics, 2008. AIM 2008. IEEE/ASME International Conference on
  • Conference_Location
    Xian
  • Print_ISBN
    978-1-4244-2494-8
  • Electronic_ISBN
    978-1-4244-2495-5
  • Type

    conf

  • DOI
    10.1109/AIM.2008.4601763
  • Filename
    4601763