• DocumentCode
    2612509
  • Title

    The Monte Carlo simulation of CT based on flat panel detector

  • Author

    Li, Shoupeng ; Li, Jianxin ; Yan, Bin ; Liu, Yongjun ; Li, Lei

  • Author_Institution
    CT Res. Center, Nat. Digital Switching Syst. Eng. & Technol. Res. Center, Zhengzhou, China
  • Volume
    5
  • fYear
    2011
  • fDate
    15-17 Oct. 2011
  • Firstpage
    2798
  • Lastpage
    2801
  • Abstract
    X-ray cone beam Computed Tomography (CT) with flat panel detector has the advantages of speed and high image resolution; it is widely used in industrial Non-Destructive Testing (NDT), medical diagnosis and many other fields. Monte Carlo simulation is the important tool in X-ray imaging field. Due to environmental noise and the output of the simulation is not accurate, the result of simulation does not match the actual one, in other words, the simulation result has some error, especially in system design, this error may have worse impact on the actual imaging system. In this paper, we propose a quartic polynomial model to describe the relationship between the simulation system output and the actual system output. We use simulated data and actual data to determine the parameters of the model. Using this model, we can obtain the approximation output of the real system from the output of the simulation system. The result shows that using this model we can obtain the actual system output with small error.
  • Keywords
    Monte Carlo methods; computerised tomography; nondestructive testing; patient diagnosis; polynomials; Monte Carlo simulation; X-ray cone beam computed tomography; X-ray imaging field; flat panel detector; image resolution; industrial nondestructive testing; medical diagnosis; quartic polynomial model; Computed tomography; Current measurement; Detectors; Monte Carlo methods; Photonics; Time measurement; X-ray imaging; Cone beam CT; Flat Panel Detector; Monte Carlo simulation; X-ray Imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing (CISP), 2011 4th International Congress on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-9304-3
  • Type

    conf

  • DOI
    10.1109/CISP.2011.6100700
  • Filename
    6100700