Title :
An improved random walk approach for yield optimization [of MMICs]
Author :
Qi, Songxin ; Yang, Quanrang
Author_Institution :
State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing, China
Abstract :
The traditional random walk approach for yield optimization is modified to further improve its efficiency. The experimental orthogonal array design is employed as an alternative to generating sample points in the circuit parameter space. The step of the random walk is modified to be adaptable. An example is given to show its high efficiency
Keywords :
MMIC; Monte Carlo methods; circuit optimisation; integrated circuit design; integrated circuit yield; network parameters; circuit parameter space; efficiency; orthogonal array design; random walk approach; sample points; yield optimization; Algorithm design and analysis; Convergence; Laboratories; MMICs; Millimeter wave circuits; Millimeter wave technology; Monte Carlo methods; Optimization methods; Robustness; Yield estimation;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-1281-3
DOI :
10.1109/ISCAS.1993.394182
