DocumentCode
2612986
Title
Evaluation of the impact of resolution-sensitivity tradeoffs on detection performance for SPECT imaging
Author
Asma, Evren ; Manjeshwar, Ravindra
Author_Institution
Functional Imaging Laboratory, General Electric Global Research Center, Niskayuna, NY 12309, USA
fYear
2008
fDate
19-25 Oct. 2008
Firstpage
3730
Lastpage
3733
Abstract
We evaluated the impact of resolution versus sensitivity tradeoffs on the detection performances of SPECT imaging systems. Images were reconstructed using penalized likelihood with quadratic penalties and the theoretical approximation for the SNR of the Hotelling observer was used as the detection metric. We compared three circularly rotating pinhole SPECT systems with identical detector areas and fields of view (FOVs): The first system consisted of a single pinhole and the projection of the FOV occupied the entire detector area at each view angle. The second system had four pinholes and no overlap between the projections due to increased minification. The third system had nine pinholes with significant overlap between the projections. The systems emphasized resolution, sensitivity and very-high number of counts via overlap, respectively. We simulated 2:1 and 4:1 contrast tumors with 5, 15 and 25 mm diameters within a 100×100×100mm3 FOV. The four and nine pinhole systems had improved detection performance over the single pinhole system for all simulated contrast and tumor sizes and had almost identical detection performances for the 5 mm tumor. For the larger tumors, the nine pinhole system was slightly better (approx. 10%). These results indicate that the sensitivity advantage gained by using four pinholes instead of one outweighs the loss in resolution and results in improved detection performance. On the other hand, the advantage gained by adding further pinholes with overlapping projections was minimal.
Keywords
Detectors; Geometry; Image reconstruction; Image resolution; Laboratories; Neoplasms; Nuclear and plasma sciences; Performance evaluation; Telephony; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
Conference_Location
Dresden, Germany
ISSN
1095-7863
Print_ISBN
978-1-4244-2714-7
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2008.4774205
Filename
4774205
Link To Document