DocumentCode :
2613127
Title :
Improved Sensitivity for Hot Spot Detection using Liquid Crystals
Author :
Burgess, David ; Tan, Peng
Author_Institution :
Hewlett Packard Corporate Quality, 1681 Page Mill Road, Building 28B, Palo Alto, California 94304
fYear :
1984
fDate :
30773
Firstpage :
119
Lastpage :
121
Keywords :
Chemicals; Crystalline materials; Failure analysis; Lighting; Liquid crystal devices; Liquid crystals; Milling machines; Optical polarization; Optical surface waves; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1984. 22nd Annual
Conference_Location :
Las Vegas, NV, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1984.362028
Filename :
4208552
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2613127
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