• DocumentCode
    2613157
  • Title

    PV performance measurement algorithms procedures and equipment

  • Author

    Emergy, K.A. ; Osterwald, C.R.

  • Author_Institution
    Solar Energy Res. Inst., Golden, CO
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    1068
  • Abstract
    The voltage bias rate, the bias direction, the premeasurement conditions, and the spectral irradiance of the light source all have an effect on the measured current versus voltage (I-V) characteristics of a photovoltaic (PV) device. These effects are quantified for a variety of different device structures. Algorithms for determining the maximum power point are compared for several devices using the same data acquisition system. The effects of voltage bias rate and direction on the I-V characteristics are quantified for several different material systems. It is pointed out that often these effects are not documented in the reporting of the I-V characteristics, and the most favorable premeasurement conditions are used instead. The I-V characteristics of two-terminal tandems are a function of the light source. Procedures have been adopted by several groups that allow the I-V characteristic of any tandem structure to be determined with respect to a fixed set of reference conditions. The algorithm used to determine the maximum power can affect the performance, causing an unrealistically high or low efficiency
  • Keywords
    data acquisition; semiconductor device testing; solar cells; test equipment; I-V characteristics; Solar cells; algorithms; bias direction; data acquisition; efficiency; maximum power point; premeasurement conditions; semiconductor device testing; spectral irradiance; tandems; voltage bias rate; Contacts; Current measurement; Error correction; Gallium arsenide; Light sources; Pulse measurements; Solar energy; Springs; Temperature measurement; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
  • Conference_Location
    Kissimmee, FL
  • Type

    conf

  • DOI
    10.1109/PVSC.1990.111781
  • Filename
    111781