A study of test system for thermal resistance of IGBT

IGBTs have the advantages of BJTs and MOSFETs, they are widely used in household appliances and industrial production. But thermal problem has affected the development of IGBT, so its accurate measurement of thermal resistance and temperature rise is very important. In this paper, we propose a new test system for thermal resistance of IGBT, in this test system, we use digital approach, choose the voltage between collector and emitter with constant current and gate-collector short as heat-sensitive parameter, the results show that this system has the advantages of accuracy and good measurement reproducibility, and it has better feasibility.