DocumentCode

2613650

Title

Reliability of High Temperature I2L Integrated Circuits

Author

Dening, D.C. ; LaCombe, D.J. ; Christou, A.

fYear

1984

fDate

30773

Firstpage

280

Lastpage

280

Keywords

Annealing; Integrated circuit reliability; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1984. 22nd Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1984.362060

Filename

4208584