Title :
Reliability of High Temperature I2L Integrated Circuits
Author :
Dening, D.C. ; LaCombe, D.J. ; Christou, A.
Keywords :
Annealing; Integrated circuit reliability; Temperature;
Conference_Titel :
Reliability Physics Symposium, 1984. 22nd Annual
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/IRPS.1984.362060
