An analysis of frequency temperature characteristics vs. film thickness of electrodes for AT-cut resonators

Author

NAKAZAWA, Mitsuo ; Suzuki, Makoto

Author_Institution

Shinshu Univ., Nagano, Japan

fYear

1997

fDate

28-30 May 1997

Firstpage

588

Lastpage

595

Abstract

This paper describes both theoretical analysis and experimental results regarding frequency temperature-electrode film thickness characteristics for AT-cut resonators. The experiments were conducted by the oscillating method over a wide temperature range from -50 to 100°C. The quadric formula between the turn-over temperature and the electrode film thickness was proposed theoretically and the coefficients of the quadric were decided by the least squares method using the experimental results. This paper also discusses a new frequency equation, taking account of the film thicknesses for AT-cut resonators

Keywords

crystal resonators; elastic constants; electrodes; least squares approximations; thermal analysis; -50 to 100 C; AT-cut resonators; electrode film thickness; frequency equation; frequency temperature characteristics; least squares method; oscillating method; quadric formula; turn-over temperature; Adhesives; Anisotropic magnetoresistance; Capacitance; Electrodes; Equations; Frequency; Least squares methods; Piezoelectric films; Reliability theory; Temperature distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International

Conference_Location

Orlando, FL

Print_ISBN

0-7803-3728-X

Type

conf

DOI

10.1109/FREQ.1997.638708

Filename

638708