DocumentCode :
2613652
Title :
An analysis of frequency temperature characteristics vs. film thickness of electrodes for AT-cut resonators
Author :
NAKAZAWA, Mitsuo ; Suzuki, Makoto
Author_Institution :
Shinshu Univ., Nagano, Japan
fYear :
1997
fDate :
28-30 May 1997
Firstpage :
588
Lastpage :
595
Abstract :
This paper describes both theoretical analysis and experimental results regarding frequency temperature-electrode film thickness characteristics for AT-cut resonators. The experiments were conducted by the oscillating method over a wide temperature range from -50 to 100°C. The quadric formula between the turn-over temperature and the electrode film thickness was proposed theoretically and the coefficients of the quadric were decided by the least squares method using the experimental results. This paper also discusses a new frequency equation, taking account of the film thicknesses for AT-cut resonators
Keywords :
crystal resonators; elastic constants; electrodes; least squares approximations; thermal analysis; -50 to 100 C; AT-cut resonators; electrode film thickness; frequency equation; frequency temperature characteristics; least squares method; oscillating method; quadric formula; turn-over temperature; Adhesives; Anisotropic magnetoresistance; Capacitance; Electrodes; Equations; Frequency; Least squares methods; Piezoelectric films; Reliability theory; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-3728-X
Type :
conf
DOI :
10.1109/FREQ.1997.638708
Filename :
638708
Link To Document :
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