DocumentCode
2614091
Title
Performance evaluation of CLEFT GaAs/CuInSe2 tandem cell circuits through solar simulator testing and computer modeling
Author
Burgess, R. ; Flora, C. ; Schneider, M.
Author_Institution
Boeing Aerosp. & Electron., Seattle, WA, USA
fYear
1990
fDate
21-25 May 1990
Firstpage
1340
Abstract
CLEFT GaAs/CuInSe2 (CIS) tandem cell development has proceeded to circuit fabrication and testing. Solar simulator tests have been conducted to characterize tandem cell circuits under various environments and configurations. Three test panels were fabricated. each containing up to 30 tandem cell modules. These panels contained circuits with the ratio of CIS cells in series to each series GaAs cell from 2:1 to 3:1 (defined as a series ratio), and circuits with 0% to 6% Imp mismatch between two substrings in series, where each substring consisted of three CIS cells in series to three GaAs cells in parallel. One panel contained a single circuit of ten closely matched 3:1 substrings in series. The electrical performance of these circuits was measured over 18°C to 55°C. Electrical performance test results demonstrated that a 3:1 series ratio maximizes circuit output at 28°C and that current mismatch between substring circuits must be tightly controlled to prevent reverse voltage bias operation
Keywords
III-V semiconductors; copper compounds; electrical engineering computing; gallium arsenide; indium compounds; simulation; solar cells; ternary semiconductors; testing; 18 to 55 degC; 21.9 percent; AM0 efficiency; CLEFT GaAs/CuInSe2 tandem cell; GaAs-CuInSe2 tandem solar cells; circuit fabrication; computer modeling; electrical performance; reverse voltage bias operation; solar simulator testing; Bonding; Circuit simulation; Circuit testing; Computational Intelligence Society; Contacts; Flexible printed circuits; Gallium arsenide; Gold; Integrated circuit interconnections; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location
Kissimmee, FL
Type
conf
DOI
10.1109/PVSC.1990.111829
Filename
111829
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