DocumentCode

2614113

Title

Aluminum Electromigration Parameters

Author

Partridge, J. ; Littlefield, G.

Author_Institution

The Charles Stark Draper Laboratory, Inc., 555 Technology Square, Cambridge, Massachusetts 02139. (617) 258-3386

fYear

1985

fDate

31107

Firstpage

119

Lastpage

125

Keywords

Aluminum; Current density; Electromigration; Extrapolation; Laboratories; Scattering; Temperature; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1985. 23rd Annual

Conference_Location

Orlando, FL, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1985.362086

Filename

4208613