مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2614113

Title :

Aluminum Electromigration Parameters

Author :

Partridge, J. ; Littlefield, G.

Author_Institution :

The Charles Stark Draper Laboratory, Inc., 555 Technology Square, Cambridge, Massachusetts 02139. (617) 258-3386

fYear :

1985

fDate :

31107

Firstpage :

119

Lastpage :

125

Keywords :

Aluminum; Current density; Electromigration; Extrapolation; Laboratories; Scattering; Temperature; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Reliability Physics Symposium, 1985. 23rd Annual

Conference_Location :

Orlando, FL, USA

ISSN :

0735-0791

Type :

conf

DOI :

10.1109/IRPS.1985.362086

Filename :

4208613

Link To Document :