Title :
Software productivity and quality measurements
Author :
Smith, D. Paul ; Yu, Weider D. ; Fujino, Kiichi ; Hemsley, James R. ; Knutson, Gerald J. ; Reifer, Donald J. ; Smith, William B.
Author_Institution :
AT&T Bell Lab., Naperville, IL, USA
Abstract :
This paper covers the following topics: software productivity and quality measurements; an approach to data-gathering to raise software productivity and quality; software quality measurement-Project Muse results; MIS software development (customer satisfaction through quality improvement); and an approach to software quality and productivity measurements for AT&T operations systems
Keywords :
quality control; software reliability; MIS software development; Project Muse; customer satisfaction; data-gathering; software productivity; software quality measurement; Area measurement; Computer industry; Customer satisfaction; National electric code; Productivity; Programming; Software measurement; Software quality; Software systems; USA Councils;
Conference_Titel :
Computer Software and Applications Conference, 1991. COMPSAC '91., Proceedings of the Fifteenth Annual International
Conference_Location :
Tokyo
Print_ISBN :
0-8186-2152-4
DOI :
10.1109/CMPSAC.1991.170181
