Title :
Continual hashing for efficient fine-grain state inconsistency detection
Author :
Lee, Jae W. ; King, Myron ; Asanovic, Krste
Author_Institution :
Comput. Sci. & Artificial Intell. Lab., Massachusetts Inst. of Technol., Cambridge, MA
Abstract :
Transaction-level modeling (TLM) allows a designer to save functional verification effort during the modular refinement of an SoC by reusing the prior implementation of a module as a golden model for state inconsistency detection. One problem in simulation-based verification is the performance and bandwidth overhead of state dump and comparison between two models. In this paper, we propose an efficient fine-grain state inconsistency detection technique that checks the consistency of two states of arbitrary size at sub- transaction (tick) granularity using incremental hashes. At each tick, the hash generates a signature of the entire state, which can be efficiently updated and compared. We evaluate the proposed signature scheme with a FIR filter and a Vorbis decoder and show that very fine-grain state consistency checking is feasible. The hash signature checking increases execution time of Bluespec RTL simulation by 1.2% for the FIR filter and by 2.2% for the Verbis decoder while correctly detecting any injected state inconsistency.
Keywords :
FIR filters; cryptography; decoding; integrated circuit design; integrated circuit testing; logic design; logic testing; system-on-chip; FIR filter; SoC modular refinement; Vorbis decoder; continual hashing; fine-grain state inconsistency detection; functional verification; hash signature checking; incremental hashes; transaction-level modeling; Artificial intelligence; Bandwidth; Computer science; Decoding; Finite impulse response filter; Integrated circuit modeling; Laboratories; Process design; Testing; Writing;
Conference_Titel :
Computer Design, 2007. ICCD 2007. 25th International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-1257-0
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2007.4601877