Title :
Knowledge sharing and KM effectiveness in technology R&D teams: transactive memory system and team-based outcome expectations perspectives
Author :
Huang, C.C. ; Huang, T.J.
Author_Institution :
Aletheia Univ., Tainan
Abstract :
R&D process can primarily be considered as a knowledge management (KM) process. In particular, knowledge sharing/transferring is perceived to be the most essential processes for knowledge management. Organizations rely on many kinds of work groups such as R&D teams to develop technologies, improve services and manage operations. Thus, this study proposes a group level research model which includes transactive memory system, network tie, team-based outcome expectations and trust to examine knowledge sharing in technology R&D teams. Besides, the relationship between KM effectiveness and knowledge sharing is also examined in technology R&D teams. Our research model is assessed using data from a sample of 248 members of technology R&D teams and is analyzed using partial least squares (PLS) method. The results of this study indicate: (1) transactive memory system and team-based outcome expectations can facilitate knowledge sharing; (2) trust and network tie can facilitate transactive memory system and (3) knowledge sharing has no effect on KM effectiveness. This study also discusses implications for the technology R&D teams based on the results of this study.
Keywords :
knowledge management; least squares approximations; organisational aspects; research and development; knowledge management; knowledge sharing; partial least squares method; team-based outcome expectations perspectives; technology R&D teams; transactive memory system; Industrial relations; Information analysis; Information technology; Knowledge management; Least squares methods; Memory management; Process design; Research and development; Research and development management; Technology management; KM effectiveness; knowledge sharing; technology R&D teams;
Conference_Titel :
Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-1529-8
Electronic_ISBN :
978-1-4244-1529-8
DOI :
10.1109/IEEM.2007.4419567