DocumentCode
2614645
Title
A Practical VLSI Characterization and Failure Analysis System for the IC User
Author
King, Randy ; Hiatt, John
Author_Institution
Hewlett-Packard Company, 1212 Valley House Drive, Rohnert Park, California 94923
fYear
1986
fDate
31503
Firstpage
87
Lastpage
94
Abstract
Instrumentation for characterization and failure analysis of VLSI devices is described. The system combines functional and parametric test capability with voltage contrast imaging techniques. Digital signal processing allows comparison of good and bad devices to isolate faults. Reasonable cost and complexity makes the system appropriate for the IC user rather than limiting it to development applications. Specific application histories are presented.
Keywords
Application specific integrated circuits; Costs; Digital signal processing; Failure analysis; History; Instruments; Limiting; System testing; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1986. 24th Annual
Conference_Location
Anaheim, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1986.362115
Filename
4208646
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