Title :
Implementing a 2-Gbs 1024-bit ½-rate low-density parity-check code decoder in three-dimensional integrated circuits
Author :
Zhou, Lili ; Wakayama, Cherry ; Panda, Robin ; Jangkrajarng, Nuttorn ; Hu, Bo ; Shi, C. J Richard
Author_Institution :
Univ. of Washington, Washington, DC
Abstract :
A 1024-bit, 1/2-rate fully parallel low-density parity-check (LDPC) code decoder has been designed and implemented using a three-dimensional (3D) 0.18 mum fully depleted silicon-on-insulator (FDSOI) CMOS technology based on wafer bonding. The 3D-IC decoder was implemented with about 8M transistors, placed on three tiers, each with one active layer and three metal layers, using 6.9 mm by 7.0 mm of die area. It was simulated to have a 2 Gbps throughput, and consume only 260 mW. This first large-scale 3D application-specific integrated circuit (ASIC) with fine-grain (5mum) vertical interconnects is made possible by jointly developing a complete automated 3D design flow from a commercial 2-D design flow combined with the needed 3D-design tools. The 3D implementation is estimated to offer more than 10 xpower-delay-area product improvement over its corresponding 2D implementation. The work demonstrated the benefits of fine-grain 3D integration for interconnect-heavy very-large-scale digital ASIC implementation.
Keywords :
CMOS integrated circuits; application specific integrated circuits; parity check codes; silicon-on-insulator; wafer bonding; 3D-IC decoder; application specific integrated circuit; automated 3D design flow; bit rate 2 Gbit/s; fine-grain vertical interconnects; low-density parity check code decoder; power 260 mW; power-delay-area product improvement; silicon-on-insulator CMOS technology; size 0.18 micron; three-dimensional integrated circuits; wafer bonding; Application specific integrated circuits; CMOS technology; Circuit simulation; Decoding; Integrated circuit interconnections; Integrated circuit technology; Parity check codes; Silicon on insulator technology; Three-dimensional integrated circuits; Wafer bonding;
Conference_Titel :
Computer Design, 2007. ICCD 2007. 25th International Conference on
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
978-1-4244-1257-0
Electronic_ISBN :
1063-6404
DOI :
10.1109/ICCD.2007.4601900