DocumentCode
2615076
Title
Accurate modeling and fault simulation of Byzantine resistive bridges
Author
Cheung, Hugo ; Gupta, Sandeep K.
Author_Institution
Texas Instrum., Dallas, TX
fYear
2007
fDate
7-10 Oct. 2007
Firstpage
347
Lastpage
353
Abstract
Many recent studies show that a resistive bridging fault may cause intermediate voltages at the bridging fault site. Since the gates in the fanout of the fault site may have distinct and multiple logic threshold voltages, namely VIL and VIH, these gates may interpret the intermediate voltage as logic ´1´, logic ´0´, or logically indeterminate. Such fault behavior is described as the bridging fault Byzantine general problem (T. Nanya et al., Nov. 1989). None of the existing models of bridging faults used by bridging fault simulators accurately captures the indeterminate logic behavior of such bridges. We present a resistive bridging fault model that accurately yet efficiently captures indeterminate logic values. We also describe an efficient PPSFP bridging fault simulator and show that all previous approaches seriously overestimate bridging fault coverage.
Keywords
circuit simulation; fault simulation; logic gates; logic testing; Byzantine resistive bridge fault simulation; logic gates; logic testing; multiple logic threshold voltage; Bridge circuits; Circuit faults; Fabrication; Instruments; Logic gates; Logic testing; RF signals; Switches; Threshold voltage; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 2007. ICCD 2007. 25th International Conference on
Conference_Location
Lake Tahoe, CA
ISSN
1063-6404
Print_ISBN
978-1-4244-1257-0
Electronic_ISBN
1063-6404
Type
conf
DOI
10.1109/ICCD.2007.4601923
Filename
4601923
Link To Document