DocumentCode :
2615188
Title :
Corrosion of Aluminum Metallization Through Flawed Polymer Passivation Layers; In-Situ Microscopy
Author :
Will, Fritz G. ; Janora, Kevin H. ; McMullen, James G. ; Yerman, Alexander J.
Author_Institution :
General Electric Corporate Research and Development, PO Box 8, Schenectady, New York 12301
fYear :
1987
fDate :
31868
Firstpage :
34
Lastpage :
41
Abstract :
Aluminum corrosion in a polymer-coated circuit model was studied using in-situ microscopy coupled with time-lapse video recording. Pinholes in the polymer coating and exposure to water with bias voltage of 40V applied between adjacent aluminum tracks resulted in fast anode corrosion, accompanied by gas evolution. A mathematical model is developed that is in good agreement with the observed current-time relationship. The rate of corrosion is controlled by the resistance of a 6000A thick water film occupying the space of the corroded Al film between wafer and polymer coating. A tentative corrosion mechanism is proposed.
Keywords :
Aluminum; Anodes; Corrosion; Coupling circuits; Metallization; Microscopy; Passivation; Polymer films; Video recording; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 1987. 25th Annual
Conference_Location :
San Diego, CA, USA
ISSN :
0735-0791
Type :
conf
DOI :
10.1109/IRPS.1987.362152
Filename :
4208686
Link To Document :
بازگشت