• DocumentCode
    2615339
  • Title

    A Comprehensive Approach to Assess Voltage Stability Margin from the Characteristics of Power Transmission Networks

  • Author

    Tsai, Tu-Cheng ; Lee, Ching-Yin ; Lee, Chun-Liang

  • Author_Institution
    Dept. of Electr. Eng., Hwa Haia Inst. of Technol., Taipei
  • fYear
    2005
  • fDate
    2005
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In this paper, the minimum singular value of power-flow Jacobian matrix and P-V curve are computed in order to accommodate the maximum number of power transfers and available active power margin on the transmission networks. Furthermore, the combination of singular vectors and V-Q curves presents a more precision and efficient approach to indicate system weak buses ranking and its reactive power quantitative analysis, and it can detect the robustness of transmission network via classified the vulnerable levels of system buses. As the system vulnerable levels are found, some critical contingencies and load shedding analyses demonstrate the variation of voltage stability margin via modulate power transmission networks. The approaches were test on Taiwan power system, a stressed, isolated and longitudinal power system, the difference and effect of voltage stability margin and system vulnerable levels were pointed out
  • Keywords
    Jacobian matrices; load flow; load shedding; power system stability; reactive power; transmission networks; Jacobian matrix; Taiwan power system; load shedding; power transmission networks; power-flow; quantitative analysis; reactive power; voltage stability margin; Computer networks; Jacobian matrices; Power system analysis computing; Power system stability; Power transmission; Reactive power; Robustness; Stability analysis; System buses; Voltage; Active power margin; P-V curve; SVD; V-Q curve; reactive power margin; voltage stability margin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transmission and Distribution Conference and Exhibition: Asia and Pacific, 2005 IEEE/PES
  • Conference_Location
    Dalian
  • Print_ISBN
    0-7803-9114-4
  • Type

    conf

  • DOI
    10.1109/TDC.2005.1547018
  • Filename
    1547018