• DocumentCode
    2615371
  • Title

    A software reliability growth model for test-effort management

  • Author

    Yamada, Shigeru ; Hishitani, Jun ; Osaki, Shunji

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan
  • fYear
    1991
  • fDate
    11-13 Sep 1991
  • Firstpage
    585
  • Lastpage
    590
  • Abstract
    A software reliability growth model incorporating the amount of test effort expenditures during the software testing phase is described. The time-dependent behavior of test-effort expenditures is described by a Weibull curve due to the flexibility. Assuming that the error detection rate to the amount of test-effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poisson process. Using this model, the method of data analysis for software reliability measurement is presented. Also, this model is applied to the prediction of additional test-effort expenditures to obtain the objective number of errors detected by software testing and the determination of the optimum time to stop software testing for release
  • Keywords
    program testing; software metrics; software reliability; statistical analysis; Weibull curve; data analysis; error detection rate; nonhomogeneous Poisson process; software reliability growth model; software reliability measurement; software testing; test-effort expenditures; test-effort management; time-dependent behavior; Computer industry; Data analysis; Phase detection; Programming; Reliability engineering; Software measurement; Software reliability; Software testing; System testing; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference, 1991. COMPSAC '91., Proceedings of the Fifteenth Annual International
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-8186-2152-4
  • Type

    conf

  • DOI
    10.1109/CMPSAC.1991.170243
  • Filename
    170243