DocumentCode :
2615371
Title :
A software reliability growth model for test-effort management
Author :
Yamada, Shigeru ; Hishitani, Jun ; Osaki, Shunji
Author_Institution :
Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan
fYear :
1991
fDate :
11-13 Sep 1991
Firstpage :
585
Lastpage :
590
Abstract :
A software reliability growth model incorporating the amount of test effort expenditures during the software testing phase is described. The time-dependent behavior of test-effort expenditures is described by a Weibull curve due to the flexibility. Assuming that the error detection rate to the amount of test-effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poisson process. Using this model, the method of data analysis for software reliability measurement is presented. Also, this model is applied to the prediction of additional test-effort expenditures to obtain the objective number of errors detected by software testing and the determination of the optimum time to stop software testing for release
Keywords :
program testing; software metrics; software reliability; statistical analysis; Weibull curve; data analysis; error detection rate; nonhomogeneous Poisson process; software reliability growth model; software reliability measurement; software testing; test-effort expenditures; test-effort management; time-dependent behavior; Computer industry; Data analysis; Phase detection; Programming; Reliability engineering; Software measurement; Software reliability; Software testing; System testing; Systems engineering and theory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Software and Applications Conference, 1991. COMPSAC '91., Proceedings of the Fifteenth Annual International
Conference_Location :
Tokyo
Print_ISBN :
0-8186-2152-4
Type :
conf
DOI :
10.1109/CMPSAC.1991.170243
Filename :
170243
Link To Document :
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