Title :
Testing of multiple-output domino logic (MODL) CMOS circuits
Author :
Jha, Niraj K. ; Tong, Qiao
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Abstract :
Multiple-output domino logic (MODL) is a dynamic CMOS logic in which complex gates can have multiple outputs for producing multiple functions. Techniques for testing MODL circuits are presented. It is shown that due to the greater observability of MODL circuits, their test sets can be considerably smaller than those derived for the conventional domino CMOS circuits. Tests for faults are derived from a comprehensive fault model which includes stuck-at, stuck-open, and stuck-on faults. Test sets for MODL circuits are inherently robust in the presence of circuit delays and timing-skews at the inputs
Keywords :
CMOS integrated circuits; integrated logic circuits; logic testing; CMOS; MODL circuits; circuit delays; complex gates; fault model; multiple-output domino logic; observability; stuck-at faults; stuck-on faults; stuck-open faults; test sets; testing; timing-skews; CMOS logic circuits; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Monitoring; Semiconductor device modeling;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.111898
