• DocumentCode
    2615483
  • Title

    On detecting single and multiple bridging faults in CMOS circuits using the current supply monitoring method

  • Author

    Lee, Kuen-Jong ; Breuer, Melvin A.

  • Author_Institution
    Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
  • fYear
    1990
  • fDate
    1-3 May 1990
  • Firstpage
    5
  • Abstract
    Several examples are presented to illustrate the limitations of current supply monitoring (CSM). Constraints on a circuit on a circuit and its test environment which guide the use of CSM are described. Under these constraints it is formally shown that all single irredundant bridging faults can be detected by single vector tests and that a test vector which detects a single bridging fault f1 also detects all multiple bridging faults that contain f1
  • Keywords
    CMOS integrated circuits; fault location; integrated circuit testing; CMOS; current supply monitoring method; irredundant bridging faults; multiple bridging faults; single bridging fault; single vector tests; test environment; CMOS logic circuits; Circuit faults; Circuit testing; Condition monitoring; Current supplies; Electrical fault detection; Fault detection; Logic gates; Logic testing; Output feedback;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/ISCAS.1990.111899
  • Filename
    111899
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2615483