Title :
On detecting single and multiple bridging faults in CMOS circuits using the current supply monitoring method
Author :
Lee, Kuen-Jong ; Breuer, Melvin A.
Author_Institution :
Dept. of Electr. Eng. Syst., Univ. of Southern California, Los Angeles, CA, USA
Abstract :
Several examples are presented to illustrate the limitations of current supply monitoring (CSM). Constraints on a circuit on a circuit and its test environment which guide the use of CSM are described. Under these constraints it is formally shown that all single irredundant bridging faults can be detected by single vector tests and that a test vector which detects a single bridging fault f1 also detects all multiple bridging faults that contain f1
Keywords :
CMOS integrated circuits; fault location; integrated circuit testing; CMOS; current supply monitoring method; irredundant bridging faults; multiple bridging faults; single bridging fault; single vector tests; test environment; CMOS logic circuits; Circuit faults; Circuit testing; Condition monitoring; Current supplies; Electrical fault detection; Fault detection; Logic gates; Logic testing; Output feedback;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.111899
